Compatible Systems RISC 2800i Instrukcja Użytkownika Strona 21

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MPC7448 RISC Microprocessor Hardware Specifications, Rev. 4
Freescale Semiconductor 21
Electrical and Thermal Characteristics
5.2.3 IEEE Std. 1149.1 AC Timing Specifications
Table 10 provides the IEEE Std. 1149.1 (JTAG) AC timing specifications as defined in Figure 8 through
Figure 11.
Table 10. JTAG AC Timing Specifications (Independent of SYSCLK)
1
At recommended operating conditions. See Table 4.
Parameter Symbol Min Max Unit Notes
TCK frequency of operation f
TCLK
033.3MHz
TCK cycle time t
TCLK
30 ns
TCK clock pulse width measured at 1.4 V t
JHJL
15 ns
TCK rise and fall times t
JR
and t
JF
—2ns
TRST
assert time t
TRST
25 ns 2
Input setup times:
Boundary-scan data
TMS, TDI
t
DVJH
t
IVJH
4
0
ns 3
Input hold times:
Boundary-scan data
TMS, TDI
t
DXJH
t
IXJH
20
25
ns 3
Valid times:
Boundary-scan data
TDO
t
JLDV
t
JLOV
4
4
20
25
ns 4
Output hold times:
Boundary-scan data
TDO
t
JLDX
t
JLOX
30
30
ns 4
TCK to output high impedance:
Boundary-scan data
TDO
t
JLDZ
t
JLOZ
3
3
19
9
ns 4, 5
Notes:
1. All outputs are measured from the midpoint voltage of the falling/rising edge of TCLK to the midpoint of the signal in question.
The output timings are measured at the pins. All output timings assume a purely resistive 50-Ω load (see Figure 7).
Time-of-flight delays must be added for trace lengths, vias, and connectors in the system.
2. TRST
is an asynchronous level sensitive signal. The time is for test purposes only.
3. Non-JTAG signal input timing with respect to TCK.
4. Non-JTAG signal output timing with respect to TCK.
5. Guaranteed by design and characterization.
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